Deposition, Optical Characterization and Durability Tests of MgF2 Antireflection Thin Films

V.Atchaiah Naidu; G.Laxmi Narayana; V.Rajashekar Reddy; M.B.Suresh; I.M.Chhbra; P.Kistaiah

doi:https://doi.org/10.14445/22315381/IJETT-V4I8P154

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Volume 4 | Issue 8 | Year 2013 | Article Id. IJETT-V4I8P154 | DOI : https://doi.org/10.14445/22315381/IJETT-V4I8P154

Deposition, Optical Characterization and Durability Tests of MgF2 Antireflection Thin Films

V.Atchaiah Naidu , G.Laxmi Narayana , V.Rajashekar Reddy , M.B.Suresh , I.M.Chhbra , P.Kistaiah

Citation :

V.Atchaiah Naidu , G.Laxmi Narayana , V.Rajashekar Reddy , M.B.Suresh , I.M.Chhbra , P.Kistaiah, "Deposition, Optical Characterization and Durability Tests of MgF2 Antireflection Thin Films," International Journal of Engineering Trends and Technology (IJETT), vol. 4, no. 8, pp. 3559-3562, 2013. Crossref, https://doi.org/10.14445/22315381/IJETT-V4I8P154

Abstract

In this study, structural and optical properties of MgF2 thin films produced by physical vapour deposition technique on the BK7 glass substrate have been investigated. Deposited films were annealed at different temperatures. Crystallinity in the material is confirmed by X - ray diffraction technique. Microstructure of the films shown uniform grain morphology. The optical prope rties have been investigated by using UV/ VIS /NIR spectrophotometer. The optical constants of the films are in good agreement with the literature data of bulk MgF2. The durability of the coating has been systematically investigated by different treatments.

Keywords

MgF2 thin film, PVD, transmission, XRD, Durability tests.

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